標(biāo)題: ASTM B 651-1983用雙束干涉顯微鏡測(cè)量鎳+鉻或銅+鎳+鉻電鍍... [打印本頁(yè)] 作者: 兌水 時(shí)間: 2009-9-13 20:16 標(biāo)題: ASTM B 651-1983用雙束干涉顯微鏡測(cè)量鎳+鉻或銅+鎳+鉻電鍍... B651-83(2001) Standard Test Method for Measurement of Corrosion Sites in Nickel Plus Chromium or Copper Plus Nickel Plus Chromium Electroplated Surfaces with the Double-Beam Interference Microscope